1 edition of **quantification of SIMS depth profiles by Maximum Entropy reconstruction** found in the catalog.

quantification of SIMS depth profiles by Maximum Entropy reconstruction

Paul Allen

- 38 Want to read
- 23 Currently reading

Published
**1994**
by typescript in [s.l.]
.

Written in English

**Edition Notes**

Thesis (Ph.D.) - University of Warwick, 1994.

Statement | Paul Allen. |

ID Numbers | |
---|---|

Open Library | OL19577408M |

The principle of maximum entropy states that the probability distribution which best represents the current state of knowledge is the one with largest entropy, in the context of precisely stated prior data (such as a proposition that expresses testable information).. Another way of stating this: Take precisely stated prior data or testable information about a probability distribution function. Scorciapino, M. A. Concentration Depth-Profile Reconstruction from ARXPS Data Using the Maximum Entropy Method – Characterization of Surface Films Formed on Ni18P Alloy. Ph.D. Thesis, University of Cagliari, Monserrato, CA, Italy, January

The quantification of SIMS depth profiles by Maximum Entropy reconstruction: DOWSETT, MG: Almajdub, Musbah. Structural studies of anodic films on pure aluminium: Bevelling methods in sputter depth profile analysis: DOWSETT, MG: Ultra-low energy SIMS depth profiling: DOWSETT, MG: Stroud, Ian Michael, Single cell imaging mass spectrometry opens up a complete new perspective for strategies in toxicological risk assessment and drug discovery. In particular, time-of-flight secondary ion mass spectrometry (ToF-SIMS) with its high spatial and depth resolution is becoming part of the imaging mass spectrometry toolbox used for single cell analysis.

• Maximum entropy (MAXENT) shape functions (Sukumar, IJNME, ) 9Imposing linear reproducibility leads to an under-determined system of linear equations for 9Use Shannon entropy (Shannon, ) and max entropy principle (Jaynes, ) to find 9Constrained optimization problem is . Abstract In this paper, we propose a maximum-entropy expectation-maximization (MEEM) algorithm. We use the proposed algorithm for density estimation. The maximum-entropy constraint is imposed for smoothness of the estimated density function. The.

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The quantification of SIMS depth profiles by Maximum Entropy reconstruction Tools Ideate RDF+XML BibTeX RIOXX2 XML RDF+N-Triples JSON Dublin Core Atom Simple Metadata Refer METS HTML Citation ASCII Citation OpenURL ContextObject EndNote MODS OpenURL ContextObject in Span MPEG DIDL EP3 XML Reference Manager NEEO RDF+N3 Eprints Application.

The quantification of SIMS depth profiles by Maximum Entropy\ud reconstruction. using the convolution integral.\ud We propose a method for the quantification of SIMS depth profiles\ud appropriate to this model, using Maximum Entropy (MaxEnt) reconstruction.\ud SIMS depth profile data differ significantly from previous applications of the Author: Paul Nicholas Allen.

We propose a method for the quantification of SIMS depth profiles appropriate to this model, using Maximum Entropy (MaxEnt) reconstruction. SIMS depth profile data differ significantly from previous applications of the MaxEnt method: the very high signal to background ratio of the technique has lead users to plot the results on a logarithmic.

Previous publications have proposed the use of reconstruction as a method of quantification of SIMS depth profiles, taking the convolution integral as an approximate model for the measurement process in the dilute limit.

We present here a demonstration of the maximum entropy (MaxEnt) reconstruction method for SIMS depth profile quantification at a number of primary ion energies. 3. The depth resolution function (DRF) Background. One of the first attempts to obtain a typical DRF applicable to sputter depth profiling was that of Ho and Lewis inassuming a Gaussian broadening function for thin (delta) layers which led to the first definition of depth resolution, Δz=2σ, later recommended by IUPAC and ASTM, with σ the standard deviation of the respective Cited by: Download Citation | Dynamic SIMS: Quantification at all depths.

| Present day ultra-large scale integration technology exploits the variation of material properties on a nanometer scale and. Quantification of secondary-ion-mass spectroscopy depth profiles using maximum entropy deconvolution with a sample independent response function R.

Bridgeland, D. Richards, A. Lovejoy, and P. Pedrick, in Secondary Ion Mass Spectrometry SIMS X, edited by A. Benninghoven, B. Hagenhoff, and H. Werner (Wiley, Chichester, ).

The application of the maximum entropy method to non‐destructive depth profiling by angle‐dependent XPS is described. The algorithm gives the set of depth profiles that has maximum Skilling‐Jaynes entropy, subject to the condition that the calculated data agree with the measured data within the experimental precision.

Fig. a: The measured SIMS depth profiles of Al (solid line), As (dotted line), Ga (dashed line) by 1 keV Cs + ions with an incident angle of 45°. 3 b: The measured and normalized Al depth profile (open circles), the MRI fitted profile (solid.

Maximum Entropy Image Reconstruction Abstract: Two-dimensional digital image reconstruction is an important imaging process in many of the physical sciences.

If the data are insufficient to specify a unique reconstruction, an additional criterion must be introduced, either implicitly or explicitly before the best estimate can be computed. Secondary Ion Mass Spectrometry (SIMS) The technique provides elemental depth profiles over a wide depth range from a few angstroms (Å) to tens of micrometers (µm).

The sample surface is sputtered/etched with a beam of primary ions (usually O 2 + or Cs +) while secondary ions formed during the sputtering process are extracted and analyzed. Maximum entropy (MaxEnt) reconstruction is a technique for computing frequency spectra from time series data, for example, a free induction decay.

It is based on the principle of information entropy introduced by Claude Shannon. The MaxEnt spectrum contains the smallest amount of information consistent with the experimental data. In conclusion, the full-width-at-half-maximum definition and measurement of depth resolution, Δz(FWHM), is found to be more appropriate than the traditional Δz(%) in order to characterize.

The new algorithm enabled us to reconstruct these depth profiles with a maximum uncertainty of ±20% for layer thickness and of ±30% for composition of the individual layers.

Moreover, the new protocol involves an iterative procedure for calculating the IMFP values of the different components, taking into account the actual depth concentration. () Deconvolution of SIMS depth profiles: Towards simple and faster techniques.

Applied Surface Science() Isomorphic classical molecular dynamics model for an excess electron in a supercritical fluid. The application of the maximum entropy method to non‐destructive depth profiling by angle‐dependent XPS is described.

The algorithm gives the set of depth profiles that has maximum Skilling‐Jaynes en. Depth profiling using secondary ion mass spectrometry (SIMS) provides profiles of high sensitivity and depth resolution.

To obtain the greatest depth resolution, low energy probes must be employed to minimize the redistribution of the sample. A study is reported of the quantification of the amount of matter by secondary ion mass spectrometry (SIMS) when depth profiling a nominally nm thick delta layer of FMOC-l-pentafluorophenylalanine in Irganox The depth profiles are made using 5 keV Ar+ cluster ions with analysis by 25 keV Bi3+ ions.

Data for 89 negative secondary ions shows profiles whose. SIMS Tutorial: Theory. This SIMS theory tutorial includes the uses of SIMS, with explanations of Ion Beam Sputtering and other effects. Today, SIMS is widely used for analysis of trace elements in solid materials, especially semiconductors and thin films.

The SIMS ion source is one of only a few to produce ions from solid samples without prior vaporization. The analysis and reconstruction of depth profiles has been of interest to researchers using both XPS and SIMS.

Of particular interest is the ability to determine interface and delta layer positions within multilayer or mixed systems. 11–14 Several studies have described the need for, and methods of, correcting for a number of depth profiling. boundaries (Sermanet et al., ), depth estimation with single monocular images (Liu et al., ) and human pose estimation in monocular images (Tompson et al., ).

Our principal contribution is a framework for Maximum Entropy Deep Inverse Reinforcement Learning (DeepIRL) based on the Maximum Entropy paradigm for IRL (Ziebart.

Depth profile of representative bilayer. Figure 2A shows a representative ToF-SIMS depth profile through a polystyrene-PMMA bilayer. The intensities of characteristic ions for each layer (Polystyrene: C 7 H 7 +, m/z 91; PMMA: C 4 H 5 O +, m/z 69; Silicon: Si +, m/z 28) are plotted on a log 10 scale against sputter time.

Within the initial polystyrene layer the intensity of C 7 H 7 + is stable. where S(f) is the unconstrained problem is to find the f that minimizes Q(f, d), where the value of the Lagrange multiplier λ is adjusted to obtain C = C 0.

C(f,d) and S(f), and thus Q(f,d), readily generalize to multiple seminal development of the “Cambridge” algorithm 6, which is both robust and highly efficient, launched the modern application of the maximum.